1. Fault-tolerance and reliability techniques for high-density random-access memories
پدیدآورنده : Chakraborty, Kanad
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، Random access memory-- Reliability,، Integrated circuits-- Fault tolerance,، Semiconeductor storage devices
رده :
TK
7895
.
M4
.
C44
2002
2. Fault-tolerance and reliability techniques for high-density random-access memories
پدیدآورنده : Chakraborty, Kanad
کتابخانه: Library of Institute for Research in Fundamental Sciences (Tehran)
موضوع : Reliability ، Random access memory,، Integrated circuits -- Fault tolerance,، Semiconductor storage devices
رده :
TK
7895
.
M4C44
